In-field automatic observation of wheat heading stage using computer vision

Published 2016 View Full Article

Authors

Keywords

Automatic observation, Heading stage, Computer vision, SIFT, FV

Journal

BIOSYSTEMS ENGINEERING

Volume 143, Issue -, Pages 28-41

Publisher

Elsevier BV

Online

2016-01-22

DOI

10.1016/j.biosystemseng.2015.12.015

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