4.5 Article

Understanding the conduction and switching mechanism of Ti/AlOx/TaOx/Pt analog memristor

Journal

PHYSICS LETTERS A
Volume 383, Issue 30, Pages -

Publisher

ELSEVIER
DOI: 10.1016/j.physleta.2019.125877

Keywords

Memristor; Switching mechanism; Tunneling barrier; Oxygen ions migration

Funding

  1. National Natural Science Foundation of China [61604177, 61471377, 61701509, 61704191, 61804181]

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In this letter, the conduction and bipolar switching mechanism of the ultrathin AlOx(3 nm)/TaOx(5 nm) memristor are investigated through the electrical characterization and elemental analysis. The AlOx/TaOx memristor exhibits high uniformity and excellent analog property after initial reset process. The following experiments and analyses demonstrate that the switching behavior could take place over the whole area of TaOx/Pt interface and is dominated by the tunneling barrier modulation induced by oxygen ions migration. (C) 2019 Elsevier B.V. All rights reserved.

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