Sizing Subwavelength Defects With Ultrasonic Imagery: An Assessment of Super-Resolution Imaging on Simulated Rough Defects

Title
Sizing Subwavelength Defects With Ultrasonic Imagery: An Assessment of Super-Resolution Imaging on Simulated Rough Defects
Authors
Keywords
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Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-07-12
DOI
10.1109/tuffc.2019.2925974

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