A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review

Published 2019 View Full Article

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Title
A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 66, Issue 11, Pages 4556-4565
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-10-08
DOI
10.1109/ted.2019.2941445

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