Design and Characterization of a 28-nm Bulk-CMOS Cryogenic Quantum Controller Dissipating Less Than 2 mW at 3 K

Title
Design and Characterization of a 28-nm Bulk-CMOS Cryogenic Quantum Controller Dissipating Less Than 2 mW at 3 K
Authors
Keywords
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Journal
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 54, Issue 11, Pages 3043-3060
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-10-12
DOI
10.1109/jssc.2019.2937234

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