3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling

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Title
3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling
Authors
Keywords
-
Journal
Biointerphases
Volume 11, Issue 2, Pages 02A301
Publisher
American Vacuum Society
Online
2015-08-08
DOI
10.1116/1.4928209

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