Characterization of YIG thin films and vacuum annealing effect by polarized neutron reflectometry and magnetotransport measurements

Title
Characterization of YIG thin films and vacuum annealing effect by polarized neutron reflectometry and magnetotransport measurements
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 115, Issue 18, Pages 182401
Publisher
AIP Publishing
Online
2019-10-28
DOI
10.1063/1.5124832

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