Characterization of YIG thin films and vacuum annealing effect by polarized neutron reflectometry and magnetotransport measurements
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Title
Characterization of YIG thin films and vacuum annealing effect by polarized neutron reflectometry and magnetotransport measurements
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 115, Issue 18, Pages 182401
Publisher
AIP Publishing
Online
2019-10-28
DOI
10.1063/1.5124832
References
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