4.2 Article

Simultaneous scanning near-field optical and X-ray diffraction microscopy for correlative nanoscale structure-property characterization

Journal

JOURNAL OF SYNCHROTRON RADIATION
Volume 26, Issue -, Pages 1790-1796

Publisher

INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577519008609

Keywords

multimodal imaging; X-ray diffraction imaging; scanning near-field optical microscopy; structure-property correlations; insulator-metal transitions; samarium sulfide; scanning probe microscopy

Funding

  1. US Department of Energy (DOE), Office of Science, Materials Science and Engineering Division
  2. US DOE, Office of Science, Basic Energy Sciences [DE-FG02-04ER46147]
  3. DOE Office of Science [DE-AC02-06CH11357]
  4. US DOE, Office of Science, Office of Workforce Development for Teachers and Scientists, Office of Science Graduate Student Research (SCGSR) program
  5. DOE [DE-SC0014664]

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A multimodal imaging instrument has been developed that integrates scanning near-field optical microscopy with nanofocused synchrotron X-ray diffraction imaging. The instrument allows for the simultaneous nanoscale characterization of electronic/near-field optical properties of materials together with their crystallographic structure, facilitating the investigation of local structure-property relationships. The design, implementation and operating procedures of this instrument are reported. The scientific capabilities are demonstrated in a proof-of-principle study of the insulator-metal phase transition in samarium sulfide (SmS) single crystals induced by applying mechanical pressure via a scanning tip. The multimodal imaging of an in situ tip-written region shows that the near-field optical reflectivity can be correlated with the heterogeneously transformed structure of the near-surface region of the crystal.

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