Software defect prediction via cost-sensitive Siamese parallel fully-connected neural networks

Title
Software defect prediction via cost-sensitive Siamese parallel fully-connected neural networks
Authors
Keywords
Siamese parallel fully-connected networks, Cost-sensitive learning, Deep learning, Few-shot learning, Software defect prediction
Journal
NEUROCOMPUTING
Volume 352, Issue -, Pages 64-74
Publisher
Elsevier BV
Online
2019-04-24
DOI
10.1016/j.neucom.2019.03.076

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