Journal
MICROSCOPY AND MICROANALYSIS
Volume 25, Issue 5, Pages 1075-1105Publisher
CAMBRIDGE UNIV PRESS
DOI: 10.1017/S143192761901482X
Keywords
compositional mapping; electron-excited X-ray microanalysis; energy dispersive X-ray spectrometry
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2018 marked the 50th anniversary of the introduction of energy dispersive X-ray spectrometry (EDS) with semiconductor detectors to electron-excited X-ray microanalysis. Initially useful for qualitative analysis, EDS has developed into a fully quantitative analytical tool that can match wavelength dispersive spectrometry for accuracy in the determination of major (mass concentration C > 0.1) and minor (0.01 <= C <= 0.1) constituents, and useful accuracy can extend well into the trace (0.001 < C < 0.01) constituent range even when severe peak interference occurs. Accurate analysis is possible for low atomic number elements (B, C, N, O, and F), and at low beam energy, which can optimize lateral and depth spatial resolution. By recording a full EDS spectrum at each picture element of a scan, comprehensive quantitative compositional mapping can also be performed.
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