Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling

Published 2019 View Full Article

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Title
Electronic and atomic structure studies of tin oxide layers using X-ray absorption near edge structure spectroscopy data modelling
Authors
Keywords
Tin oxides, XANES, Linear combination, Nanolayer, First-principles calculation, Electronic structure
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 99, Issue -, Pages 28-33
Publisher
Elsevier BV
Online
2019-04-15
DOI
10.1016/j.mssp.2019.04.006

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