High-quality, high-throughput cryo-electron microscopy data collection via beam tilt and astigmatism-free beam-image shift

Published 2019 View Full Article

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Title
High-quality, high-throughput cryo-electron microscopy data collection via beam tilt and astigmatism-free beam-image shift
Authors
Keywords
Cryo-EM data collection, Beam-image shift, Automatic coma determination program, Astigmatism
Journal
JOURNAL OF STRUCTURAL BIOLOGY
Volume -, Issue -, Pages -
Publisher
Elsevier BV
Online
2019-09-25
DOI
10.1016/j.jsb.2019.09.013

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