First Observations on the Trap-Induced Avalanche Instability and Safe Operating Area Concerns in AlGaN/GaN HEMTs

Published 2019 View Full Article

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Title
First Observations on the Trap-Induced Avalanche Instability and Safe Operating Area Concerns in AlGaN/GaN HEMTs
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 66, Issue 8, Pages 3433-3440
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-06-15
DOI
10.1109/ted.2019.2919491

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