Auger electron spectroscopy and UV–Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces

Title
Auger electron spectroscopy and UV–Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces
Authors
Keywords
Oxide layer, Copper, UV–vis spectroscopy, Multivariate, Auger electron spectroscopy
Journal
APPLIED SURFACE SCIENCE
Volume 486, Issue -, Pages 354-361
Publisher
Elsevier BV
Online
2019-05-08
DOI
10.1016/j.apsusc.2019.05.028

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