Influence of RF sputtering power and thickness on structural and optical properties of NiO thin films

Title
Influence of RF sputtering power and thickness on structural and optical properties of NiO thin films
Authors
Keywords
-
Journal
Materials Research Express
Volume 6, Issue 9, Pages 096440
Publisher
IOP Publishing
Online
2019-07-26
DOI
10.1088/2053-1591/ab317d

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started