Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling

Title
Peak calling by Sparse Enrichment Analysis for CUT&RUN chromatin profiling
Authors
Keywords
CUT&RUN, Epigenome profiling, Peak calling
Journal
Epigenetics & Chromatin
Volume 12, Issue 1, Pages -
Publisher
Springer Science and Business Media LLC
Online
2019-07-12
DOI
10.1186/s13072-019-0287-4

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