Journal
JOURNAL OF THE TEXTILE INSTITUTE
Volume 111, Issue 2, Pages 235-248Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/00405000.2019.1631095
Keywords
Fabrics; textiles; electroconductive yarn; microstructures; computational modelling
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Funding
- National Natural Science Foundation of China [61572124]
- Graduate Student Innovation Fund of Donghua University [CUSF-DH-D-2019050]
- Fundamental Research Funds for the Central Universities [CUSF-DH-D-2019050]
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In this article, a theoretical model of resistive network for woven conductive fabric is proposed to compute the resistance in warp and weft direction respectively. In order to enhance the accuracy of predicting the contact resistance and the length-related resistance, two cross-sectional entities, i.e. racetrack shape and elliptical shape are employed according to the density relationship between warp and weft directions. The comparison between the theoretical predictions of the resistance and the experimental results indicate that the proposed model has better accuracy, with standard deviations of 0.046 in warp direction and 0.0059 in weft direction. A further comparison with previous work has revealed an average improvement around 138.72%. It is believed this work has provided a solid theoretical basis for the precise resistance evaluation on the development of electronic textile based on woven structure.
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