Structure and antireflection properties of SiNWs arrays form mc-Si wafer through Ag-catalyzed chemical etching

Published 2016 View Full Article

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Title
Structure and antireflection properties of SiNWs arrays form mc-Si wafer through Ag-catalyzed chemical etching
Authors
Keywords
Multi-crystalline silicon (mc-Si), Ag-catalyzed chemical etching, SiNWs films, Structural characterization, Anti-reflectance
Journal
APPLIED SURFACE SCIENCE
Volume 369, Issue -, Pages 232-240
Publisher
Elsevier BV
Online
2016-02-18
DOI
10.1016/j.apsusc.2016.02.028

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