Ellipsometric study and application of rubrene thin film in organic Schottky diode

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Title
Ellipsometric study and application of rubrene thin film in organic Schottky diode
Authors
Keywords
Rubrene, Spectroscopic Ellipsometry, Optical constant, Organic Schottky diode
Journal
APPLIED SURFACE SCIENCE
Volume 388, Issue -, Pages 396-400
Publisher
Elsevier BV
Online
2015-12-18
DOI
10.1016/j.apsusc.2015.12.111

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