4.6 Article

Nonvolatile transtance change random access memory based on magnetoelectric P(VDF-TrFE)/Metglas heterostructures

Journal

APPLIED PHYSICS LETTERS
Volume 109, Issue 25, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4972304

Keywords

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Funding

  1. National Key Research Program of China [2016YFA0300700]
  2. National Natural Science Foundation of China [11534015, 51371192, 11227405, 11274363, 51671213]

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Transtance change random access memory (TCRAM) is a type of nonvolatile memory based on the nonlinear magnetoelectric coupling effects of multiferroics. In this work, ferroelectric P(VDF-TrFE) thin films were prepared on Metglas foil substrates by the sol-gel technique to form multiferroic heterostructures. The magnetoelectric voltage coefficient of the heterostructure can be switched reproducibly to different levels between positive and negative values by applying selective electric-field pulses. Compared with bulk multiferroic heterostructures, the polarization switching voltage was reduced to 7V. Our facile technological approach enables this organic magnetoelectric heterostructure as a promising candidate for the applications in multilevel TCRAM devices. Published by AIP Publishing.

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