Quantifying point defects in Cu2ZnSn(S,Se)4 thin films using resonant x-ray diffraction
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Title
Quantifying point defects in Cu2ZnSn(S,Se)4 thin films using resonant x-ray diffraction
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 109, Issue 16, Pages 161901
Publisher
AIP Publishing
Online
2016-10-18
DOI
10.1063/1.4964738
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Related references
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