Quantifying the intrinsic surface charge density and charge-transfer resistance of the graphene-solution interface through bias-free low-level charge measurement
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Title
Quantifying the intrinsic surface charge density and charge-transfer resistance of the graphene-solution interface through bias-free low-level charge measurement
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 109, Issue 1, Pages 013103
Publisher
AIP Publishing
Online
2016-07-06
DOI
10.1063/1.4955404
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