Measurement and Extraction of Parasitic Parameters of Quasi-Vertical Schottky Diodes at Submillimeter Wavelengths

Published 2019 View Full Article

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Title
Measurement and Extraction of Parasitic Parameters of Quasi-Vertical Schottky Diodes at Submillimeter Wavelengths
Authors
Keywords
-
Journal
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
Volume 29, Issue 7, Pages 474-476
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-06-08
DOI
10.1109/lmwc.2019.2918295

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