A Robust on-Wafer Large Signal Transistor Characterization Method at mm-Wave Frequency

Published 2019 View Full Article

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Title
A Robust on-Wafer Large Signal Transistor Characterization Method at mm-Wave Frequency
Authors
Keywords
-
Journal
CHINESE JOURNAL OF ELECTRONICS
Volume 28, Issue 4, Pages 871-877
Publisher
Institution of Engineering and Technology (IET)
Online
2019-07-23
DOI
10.1049/cje.2019.05.013

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