Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3 Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses

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Title
Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3 Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 11, Issue 26, Pages 23673-23680
Publisher
American Chemical Society (ACS)
Online
2019-06-06
DOI
10.1021/acsami.9b04069

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