Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions

Title
Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 11, Issue 23, Pages 21018-21029
Publisher
American Chemical Society (ACS)
Online
2019-05-31
DOI
10.1021/acsami.9b02033

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