4.8 Article

Interfacial Triggering of Conductive Filament Growth in Organic Flexible Memristor for High Reliability and Uniformity

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 11, Issue 33, Pages 30108-30115

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.9b10491

Keywords

organic memristor; flexible memristor; resistive switching; conductive filament; high reliability; high uniformity; Ostwald ripening

Funding

  1. Samsung Display Co.
  2. Brain Korea 21 Plus Project - Ministry of Education of Korea

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We demonstrate the physical pictures of the localization of the conductive filaments (CFs) growth in flexible electrochemical metallization (ECM) memristors through an interfacial triggering (IT) into the polymer electrolyte. The IT sites (ITSs), capable of controlling the pathways of the CF growth, are formed at the electrode-polymer interfaces via the Ostwald ripening at low temperatures (below 230 degrees C). The injection and migration of metal ions and the resultant CF growth are found to be effectively controlled through the ITSs with the local electric field enhancement. The reliability, uniformity, and switching voltage of the device are much improved by the presence of the ITSs. Our flexible ECM memristor exhibits a high mechanical flexibility and a stable memory performance under repeated bending deformations.

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