Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 52, Issue -, Pages 571-578Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600576719004394
Keywords
coherent diffraction imaging; diffraction; microparticles; crystallinity; nanoscale morphology
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Funding
- NIGMS [P41-GM103311]
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This article presents a combined approach where quantitative forward-scattering coherent diffraction imaging (CDI) is supported by crystal diffraction using 8.1keV synchrotron X-ray radiation. The method allows the determination of the morphology, mass density and crystallinity of an isolated microscopic specimen. This approach is tested on three homogeneous samples made of different materials with different degrees of crystallinity. The mass density and morphology are revealed using three-dimensional coherent diffraction imaging with a resolution better than 36nm. The crystallinity is extracted from the diffraction profiles measured simultaneously with coherent diffraction patterns. The presented approach extends CDI to structural characterization of samples when crystallinity aspects are of interest.
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