Multifrequency nanoscale impedance microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes

Published 2019 View Full Article

Authors

Keywords

Nanoscale impedance microscopy, Multifrequency voltage perturbation, Boron-doped diamond, Heterogeneity, Electrode termination

Journal

ULTRAMICROSCOPY

Volume 199, Issue -, Pages 34-45

Publisher

Elsevier BV

Online

2019-02-11

DOI

10.1016/j.ultramic.2019.01.004

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