Journal
MATERIALS RESEARCH BULLETIN
Volume 112, Issue -, Pages 346-353Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.materresbull.2019.01.004
Keywords
Electronic materials; Oxides; Electrochemical measurements; Electrochemical properties; Energy storage
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Thin-film electrodes of manganese oxide were synthesized via the thermal decomposition of various ink complexes consisting of manganese (II), formate (Mnf), triethylenetetramine (TETA), and hexanol. Inks complexed with various molar ratios of TETA to Mnf were calcined at 260 degrees C for 30 min under air. The molar ratio of TETA to Mnf was varied from 0 to 6.0. The pseudocapacitive properties of the thin-film electrodes were evaluated via cyclic voltammetry measurement, and the capacitance degradation was evaluated via galvanostatic charge discharge at 0.5 mA cm(-2) for 1000 cycles. The thin-film electrode synthesized from ink complexed with a molar ratio of 0.1 showed the highest level of specific capacitance at 2190 F g(-1). and good cycling stability was confirmed. The thin-film electrode consisted of Mn3O4 and had a mesh-like morphology that was generated by the dissolution of the remaining Mnf by the electrolyte solution, which resulted in high specific capacitance.
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