Highly Reliable a-Si:H TFT Gate Driver With Precharging Structure for In-Cell Touch AMLCD Applications

Title
Highly Reliable a-Si:H TFT Gate Driver With Precharging Structure for In-Cell Touch AMLCD Applications
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 66, Issue 4, Pages 1789-1796
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2019-03-09
DOI
10.1109/ted.2019.2901287

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