Predicting wheat grain yield and spatial variability at field scale using a simple regression or a crop model in conjunction with Landsat images

Published 2019 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Predicting wheat grain yield and spatial variability at field scale using a simple regression or a crop model in conjunction with Landsat images
Authors
Keywords
Landsat, Crop growth model, Leaf area index, Yield, Wheat
Journal
COMPUTERS AND ELECTRONICS IN AGRICULTURE
Volume 159, Issue -, Pages 75-83
Publisher
Elsevier BV
Online
2019-03-04
DOI
10.1016/j.compag.2019.02.026

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.