Journal
APPLIED PHYSICS EXPRESS
Volume 12, Issue 6, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.7567/1882-0786/ab1b19
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Funding
- National Natural Science Foundation of China [61604098]
- Shenzhen Science and Technology Innovation Commission [JCYJ20170412110137562, JCYJ20170302143001451]
- Research Grants Council of the Hong Kong SAR
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We investigated the threshold voltage (V-TH) shift in p-GaN gate AIGaN/GaN power HEMTs under both forward and reverse gate bias conditions at different temperatures. With increasing forward gate bias, the V-TH first positively shifted and then decreased. While at the reverse gate bias, V-TH shifts monotonically increased towards the positive direction. Positive V-TH shifts were due to electron trapping while its decrease was attributed to the optical pumping by the internal electroluminescence (EL). The EL emission from the p-GaN gate region was captured. A light illumination test was performed to verify the effectiveness of optical pumping. (C) 2019 The Japan Society of Applied Physics
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