The influence of X-ray diffraction pattern angular range on Rietveld refinement results used for quantitative analysis, crystallite size calculation and unit-cell parameter refinement

Title
The influence of X-ray diffraction pattern angular range on Rietveld refinement results used for quantitative analysis, crystallite size calculation and unit-cell parameter refinement
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 52, Issue 2, Pages -
Publisher
International Union of Crystallography (IUCr)
Online
2019-02-15
DOI
10.1107/s1600576719000621

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