4.7 Article

Guided wave time-reversal imaging of macroscopic localized inhomogeneities in anisotropic composites

Journal

STRUCTURAL HEALTH MONITORING-AN INTERNATIONAL JOURNAL
Volume 18, Issue 5-6, Pages 1803-1819

Publisher

SAGE PUBLICATIONS LTD
DOI: 10.1177/1475921719830612

Keywords

Anisotropic composites; elastic guided waves; time-reversal approach; asymptotic representation; damage imaging

Funding

  1. Ministry of Education and Science of the Russian Federation [9.1022.2017/4.6]
  2. Alexander von Humboldt Foundation

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Estimation of damage position and extent in the inspected structure is among the emerging problems of active structural health monitoring (SHM) with elastic guided waves. Unlike conventional non-destructive testing (NDT) techniques, which assume continuous surface scanning, SHM systems operate only with data from a limited number of sensors. Nevertheless, in the case of isotropic (metal) plate-like structures, computational time-reversal techniques have proved to be effective for estimating in situ the location and size of wave sources and/or local scatterers within the SHM concept. With composite plates, the reconstruction procedure faces additional difficulties associated with the complexity of wave phenomena caused by their lamination and anisotropy. In this article, we present an extension of the time reversal technique for the case of composite laminate plate-like structures. This technique relies on the simulation of the reversed guided waves generated by reciprocal surface loads applied at a sparse set of measurement points of a real sensor network. The proposed implementation is based on the far-field asymptotics for guided waves generated in arbitrarily anisotropic laminate waveguides by a prescribed source, which have been derived from the path integral representations in terms of Green's matrix for the structures considered. The performance of this approach has been experimentally tested on cross-ply carbon fiber-reinforced plastic plates showing reliable and adequate results for both active (piezoactuators) and passive (artificial defects) source characterization.

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