High-Sensitivity Microwave Sensor Based on An Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization
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Title
High-Sensitivity Microwave Sensor Based on An Interdigital-Capacitor-Shaped Defected Ground Structure for Permittivity Characterization
Authors
Keywords
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Journal
SENSORS
Volume 19, Issue 3, Pages 498
Publisher
MDPI AG
Online
2019-01-26
DOI
10.3390/s19030498
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