A cost-driven reliability demonstration plan based on accelerated degradation tests

Published 2018 View Full Article

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Title
A cost-driven reliability demonstration plan based on accelerated degradation tests
Authors
Keywords
Degradation model, Light-emitting diode (LED), Nonlinear random-coefficients model, Operating characteristic (OC) curve, Wiener process
Journal
RELIABILITY ENGINEERING & SYSTEM SAFETY
Volume 183, Issue -, Pages 226-239
Publisher
Elsevier BV
Online
2018-11-24
DOI
10.1016/j.ress.2018.11.017

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