Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi2Te4 Films
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Title
Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet
MnBi2Te4
Films
Authors
Keywords
-
Journal
PHYSICAL REVIEW LETTERS
Volume 122, Issue 10, Pages -
Publisher
American Physical Society (APS)
Online
2019-03-14
DOI
10.1103/physrevlett.122.107202
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