Defect‐Pattern‐Induced Fingerprints in the Electron Density of States of Strained Graphene Layers: Diffraction and Simulation Methods

Title
Defect‐Pattern‐Induced Fingerprints in the Electron Density of States of Strained Graphene Layers: Diffraction and Simulation Methods
Authors
Keywords
-
Journal
Publisher
Wiley
Online
2019-03-20
DOI
10.1002/pssb.201800406

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