Journal
NANO RESEARCH
Volume 12, Issue 4, Pages 939-946Publisher
TSINGHUA UNIV PRESS
DOI: 10.1007/s12274-019-2328-5
Keywords
electron microscopy; scanning precession electron diffraction; Eshelby twist; screw dislocation; nanowire; indium phosphide
Categories
Funding
- CNPq [302767/2012-6, 479486/ 2012-3]
- Royal Society
- European Research Council [291522-3DIMAGE]
- EPSRC [EP/R025517/1]
- FAPESP [2013/02300-1, 2013/10957-0]
- European Union [312483]
- Fundacao de Amparo a Pesquisa do Estado de Sao Paulo (FAPESP) [13/10957-0] Funding Source: FAPESP
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Transmission electron microscopes (TEM) are widely used in nanotechnology research. However, it is still challenging to characterize nanoscale objects; their small size coupled with dynamical diffraction makes interpreting real- or reciprocal-space data difficult. Scanning precession electron diffraction ((S)PED) represents an invaluable contribution, reducing the dynamical contributions to the diffraction pattern at high spatial resolution. Here a detailed analysis of wurtzite InP nanowires (30-40 nm in diameter) containing a screw dislocation and an associated wire lattice torsion is presented. It has been possible to characterize the dislocation with great detail (Burgers and line vector, handedness). Through careful measurement of the strain field and comparison with dynamical electron diffraction simulations, this was found to be compatible with a Burgers vector modulus equal to one hexagonal lattice cell parameter despite the observed crystal rotation rate being larger (ca. 20%) than that predicted by classical elastic theory for the nominal wire diameter. These findings corroborate the importance of the (S)PED technique for characterizing nanoscale materials.
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