Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale

Title
Correlative Atom Probe Tomography and Transmission Electron Microscopy Analysis of Grain Boundaries in Thermally Grown Alumina Scale
Authors
Keywords
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Journal
MICROSCOPY AND MICROANALYSIS
Volume 25, Issue 1, Pages 11-20
Publisher
Cambridge University Press (CUP)
Online
2019-02-04
DOI
10.1017/s143192761801557x

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