Evolutions on surface chemistry, microstructure, morphology and electrical characteristics of SnO2/p-Si heterojuction under various annealing parameters
Evolutions on surface chemistry, microstructure, morphology and electrical characteristics of SnO2/p-Si heterojuction under various annealing parameters
Authors
Keywords
Tin oxide, Heterojuction, Annealing, XPS, Surface chemistry, Oxide films
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