Chemical and structural analysis of low-temperature excimer-laser annealing in indium-tin oxide sol-gel films

Published 2018 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Chemical and structural analysis of low-temperature excimer-laser annealing in indium-tin oxide sol-gel films
Authors
Keywords
Indium-tin oxide (ITO), Excimer-laser annealing (ELA), X-ray photoemission spectroscopy (XPS), Transmission electron microscopy (TEM)
Journal
CURRENT APPLIED PHYSICS
Volume 19, Issue 2, Pages 168-173
Publisher
Elsevier BV
Online
2018-12-12
DOI
10.1016/j.cap.2018.12.005

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.