Application of MIS-CELIV technique to measure hole mobility of hole-transport material for organic light-emitting diodes

Title
Application of MIS-CELIV technique to measure hole mobility of hole-transport material for organic light-emitting diodes
Authors
Keywords
-
Journal
AIP Advances
Volume 8, Issue 10, Pages 105001
Publisher
AIP Publishing
Online
2018-10-01
DOI
10.1063/1.5045711

Ask authors/readers for more resources

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started