A continuous sampling pattern design algorithm for atomic force microscopy images

Title
A continuous sampling pattern design algorithm for atomic force microscopy images
Authors
Keywords
Undersampling, Compressive sensing, Image reconstruction, Atomic force microscopy, Sampling pattern design
Journal
ULTRAMICROSCOPY
Volume 196, Issue -, Pages 167-179
Publisher
Elsevier BV
Online
2018-11-01
DOI
10.1016/j.ultramic.2018.10.013

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