3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography

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Title
3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography
Authors
Keywords
Thin film photovoltaics, Ordered vacancy compounds (OVC), Atom probe tomography, Point defect density, Transmission electron microscopy
Journal
ACTA MATERIALIA
Volume 102, Issue -, Pages 32-37
Publisher
Elsevier BV
Online
2015-09-27
DOI
10.1016/j.actamat.2015.09.035

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