Electronic noise due to temperature differences in atomic-scale junctions

Title
Electronic noise due to temperature differences in atomic-scale junctions
Authors
Keywords
-
Journal
NATURE
Volume 562, Issue 7726, Pages 240-244
Publisher
Springer Nature America, Inc
Online
2018-10-03
DOI
10.1038/s41586-018-0592-2

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started