Mesostructured HfxAlyO2 Thin Films as Reliable and Robust Gate Dielectrics with Tunable Dielectric Constants for High-Performance Graphene-Based Transistors

Title
Mesostructured HfxAlyO2 Thin Films as Reliable and Robust Gate Dielectrics with Tunable Dielectric Constants for High-Performance Graphene-Based Transistors
Authors
Keywords
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Journal
ACS Nano
Volume 10, Issue 7, Pages 6659-6666
Publisher
American Chemical Society (ACS)
Online
2016-06-30
DOI
10.1021/acsnano.6b01734

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