Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy

Published 2016 View Full Article

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Title
Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy
Authors
Keywords
-
Journal
ACS Nano
Volume 10, Issue 2, Pages 2528-2535
Publisher
American Chemical Society (ACS)
Online
2016-01-29
DOI
10.1021/acsnano.5b07418

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