Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy

Published 2016 View Full Article

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Title
Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 8, Issue 27, Pages 17642-17650
Publisher
American Chemical Society (ACS)
Online
2016-06-16
DOI
10.1021/acsami.6b03822

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